Circuit element measuring apparatus and method for measuring a p

Details Circuit element measuring apparatus and method for measuring a p Circuit element measuring apparatus and method for measuring a p

1992-09-28

1993-06-01

Strecker, Gerard R.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324649, 324691, G01R 2700

Patent

active

052163733

ABSTRACT:
A circuit element measuring apparatus for measuring a parameter of a device under test (DUT) includes a signal source, a voltmeter, a zero detection amplifier, and a compensation network all of which are coupled to the DUT by four shielded lines. The compensation network is also coupled to a range resistance. The compensation network provides two independent sets of correction data. One is based on the length of the shielded line and the other is based on the range resistance used. The parameter being measured can then be adjusted by the appropriate set of correction data to provide a more accurate measurement. A method of operating the circuit element measuring apparatus for measuring the parameter of the DUT by generating the two sets of correction data and adjusting the parameter accordingly.

REFERENCES:
patent: 5014012 (1991-05-01), Kuboyama et al.
Kohichi Maeda et al "Multi-Frequency LCR Meters Test Components Under Realistic Conditions" Hewlett-Packard Journal, pp. 24-31, Feb. 1979.
Yoh Narimatsu et al "A Versatile Low Frequency Impedance Analyzer with an Integral Tracking Gain-Phase Meter" Hewlett-Packard Journal pp. 22-28, Sep., 1981.

Affiliated with

Also associated with

Rating

Circuit element measuring apparatus and method for measuring a p does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuit element measuring apparatus and method for measuring a p, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit element measuring apparatus and method for measuring a p will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1817595