Circuit device and method of measuring clock jitter

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing

Reexamination Certificate

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C327S153000

Reexamination Certificate

active

07816960

ABSTRACT:
In an embodiment, a method is disclosed that includes receiving a clock signal at a delay chain of a circuit device and determining a value of the clock signal at a selected point within the delay chain. The method also includes adjusting the selected point when the value does not indicate detection of an edge of the clock signal.

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