Circuit design for point-to-point chip for high speed testing

Details Circuit design for point-to-point chip for high speed testing Circuit design for point-to-point chip for high speed testing

1992-12-30

1996-07-02

Miska, Vit W.

Horology: time measuring systems or devices

Time interval

Electrical or electromechanical

324 731, 324710, G04F 800, G01R 1073

Patent

active

055329837

ABSTRACT:
A test assembly for testing integrated circuits. The assembly includes a test chip that is located between the integrated circuit (IC) and a tester. The test chip has a very low input capacitance that approximates an open circuit, and has an impedance that matches the impedance of the integrated circuit and tester. The matching impedance of the test chip reduces the amount of signal ringing between the integrated circuit and tester.

REFERENCES:
patent: 4801871 (1989-01-01), Tada et al.
patent: 4862072 (1989-08-01), Harris et al.
patent: 4928062 (1990-05-01), Miles et al.
patent: 5057783 (1991-10-01), Gubisch

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