Circuit board testing system using free space optical...

Details Circuit board testing system using free space optical... Circuit board testing system using free space optical...

2011-01-04

2011-01-04

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07863912

ABSTRACT:
System including backplane, and first and second circuit boards. First circuit board is attached to backplane and has first optical signal transmitter. Second circuit board is attached to backplane and has first optical signal receiver. First optical signal transmitter and first optical signal receiver are separated by free space and form optical communication link configured for circuit board test signal communication from first circuit board to second circuit board through the free space. Method includes providing backplane and first and second circuit boards, where first circuit board is attached to backplane and has first optical signal transmitter, and second circuit board is attached to backplane and has first optical signal receiver. First optical signal transmitter and first optical signal receiver are separated by free space, and form optical communication link. Method additionally includes transmitting circuit board test signal from first circuit board to second circuit board through the free space.

REFERENCES:
patent: 6601007 (2003-07-01), Amir et al.
patent: 6863453 (2005-03-01), Wang et al.
patent: 7289692 (2007-10-01), Wasserman et al.
patent: 7412123 (2008-08-01), Mader et al.
patent: 2005/0047795 (2005-03-01), Windover et al.
patent: 2008/0304832 (2008-12-01), Williams
Collins, Pete, “Design Considerations in Using 1149.1 as a Backplane Test Bus,” JTAG Technologies, [8 pp.—First Version of Two]; downloaded from http://www.molesystems.com/BTW/material/BTW03/BTW03%20Session%206%20Papers/Design%20Considerations%201149%20Backplane%20(6.1).pdf.
Collins, Pete, “Design Considerations in Using 1149.1 As a Backplane Test Bus,” JTAG Technologies, [25 pp.—Second Version of Two]; downloaded from http://www.molesystems.com/BTW/material/BTW03/BTW03%20Session%206%20Slides/6-1%20PeteCollins-Slides.pdf.
Lenkisch, Andreas, “ATCA Backplanes,” PRAXIS Profiline—AdvancedTCA, 3pp.
“Strategy White Paper, AdvancedTCA—‘A common platform concept to improve product engineering’,” Alcatel, Jul. 2005, 12 pp.
“AdvancedTCA PICMG 3.0 Short Form Specification,” PCI Industrial Computers Manufacturers Group, 34pp.
“JTAG—A technical overview,” 6 pp., downloaded from http://www.xjtag.com/support-jtag/jtag-technical-guide.php.
“Advanced Telecommunications Computing Architecture,” 5 pp., downloaded from http://en.wikipedia.org/wiki/Advanced—Telecommunications—Computing—Architecture.
“Backplane,” 4 pp., downloaded from http://en.wikipedia.org/wiki/Backplane.
Oshana, Rob, “Introduction to JTAG,” 5 pp., downloaded from http://www.embedded.com/columns/beginerscorner/9900782?—requestid=23571.
“Application Note, IEEE Standard 1149.1 (JTAG) in the SX/RTSX/SX-A/eX/RT54SX-S Families,” 12 pp., Actel Corporation.
“Advanced TCA Tutorial,” 87pp, SuperComm, May 23, 2004, downloaded from http://www.picmg.org/v2internal
ewinitiative.htm.

Affiliated with

Also associated with

Rating

Circuit board testing system using free space optical... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuit board testing system using free space optical..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit board testing system using free space optical... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2658759