Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent
1975-11-21
1976-12-07
Krawczewicz, Stanley T.
Electricity: measuring and testing
Conductor identification or location
Inaccessible
324 28CR, 324158P, G01R 2702
Patent
active
039965147
ABSTRACT:
Measurement of the contact resistance between printed circuit patterns on a circuit board and contacts within a circuit board connector is facilitated by apparatus for gaining access to the measurement points without disruption of the electrical connections between the circuit board and the connector. The apparatus includes an electrically insulated handle to which is affixed a pair of finger probes and a pair of length-adjustable pogo probes. The finger probes engage a conductor finger on the circuit board and make electrical contact therewith. Correspondingly, the pogo probes engage a contact within the connector and make electrical contact with it. Application of a known constant current through one finger and one pogo probe and measurement of the voltage appearing between the other finger and pogo probe yields the contact resistance between the conductor finger and the connector contact without disruption of the electrical connection therebetween.
REFERENCES:
patent: 3335365 (1967-08-01), Libhart
patent: 3417323 (1968-12-01), Williamson
Diode Testing, Electromechanical Design, Sept. 1961, pp. 24 & 26.
Smith, Probe for Testing Memory Plane, IBM Technical Disclosure Bulletin, Apr. 1966, pp. 1478, 1479.
Brown Vernon Letchworth
Carrillo Leo
Sharma Nawal Kishore
Bell Telephone Laboratories Incorporated
Fisher John W.
Krawczewicz Stanley T.
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