Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-01-04
2011-01-04
Hollington, Jermele M (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07863921
ABSTRACT:
A circuit board (CB) and method for automatic testing of an electronic device under test (DUT). The circuit board (CB) has a first terminal (T1) for coupling to automatic test equipment (ATE) including a first signal generator (SG1), a second terminal (T2) for coupling to the device under test (DUT), a circuit path (W1) interconnecting the first and second terminals (T1, T2), and a PIN (Positive Intrinsic Negative) diode (D1) having one of its cathode (CA) and anode (AN) connected to the circuit path (W1). A third terminal (T3) for coupling to a second signal generator (SG2) is connected to the other of the cathode (CA) and anode (AN). The PIN diode (D1) is arranged so that the length of its connection with the circuit path (W1) is electrically short with respect to the signal frequency of the test signal.
REFERENCES:
patent: 5010297 (1991-04-01), Babcock
patent: 6594599 (2003-07-01), Kent et al.
patent: 6629282 (2003-09-01), Sugamori et al.
patent: 6639397 (2003-10-01), Roth et al.
patent: 7240259 (2007-07-01), Rottacker et al.
patent: 2002/0121904 (2002-09-01), Hauptman
patent: 2002/0125878 (2002-09-01), Jones et al.
patent: 2002/0125896 (2002-09-01), Roth et al.
patent: 0145194 (1985-06-01), None
patent: 1 600 874 (2005-11-01), None
Brigitte Vilz, authorized officer, International Searching Authority, Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration, date of mailing Dec. 10, 2008, International Application No. PCT/EP2008/062695, International filing date Sep. 23, 2008.
Brady III Wade J.
Hollington Jermele M
Patti John J.
Telecky , Jr. Frederick J.
Texas Instruments Deutschland GmbH
LandOfFree
Circuit board and method for automatic testing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Circuit board and method for automatic testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit board and method for automatic testing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2721553