Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-08-09
2005-08-09
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S713000
Reexamination Certificate
active
06927584
ABSTRACT:
A circuit includes i sensors interconnected in an (n×m) matrix circuit with n row conductors and m column conductors, where i, n, and m are natural numbers different than zero and where 1≦i≦n×m, each of the n row and m column conductors include a first and a second conductor end. The first conductor end of the n row conductors and the m column conductors is connectable to an evaluation circuit, and each of the i sensors are connected between two respective conductors from the n row and the m column conductors. A first conductor end of an at least one return conductor is connectable to the evaluation circuit and a second conductor end of the at least one return conductor is in contact with the second conductor end of one of the n row conductors or one of the m column conductors.
REFERENCES:
patent: 5276400 (1994-01-01), Denyer et al.
patent: 5504471 (1996-04-01), Lund
patent: 6522155 (2003-02-01), Pietsch et al.
patent: 0 895 091 (1999-02-01), None
patent: WO 01 18515 (2001-03-01), None
Deb Anjan
Dole Timothy J.
IEE International Electronics & Engineering S.A.
McCormick Paulding & Huber LLP
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