Thermal measuring and testing – Thermal calibration system
Reexamination Certificate
2009-02-11
2011-12-13
Smith, R. A. (Department: 2841)
Thermal measuring and testing
Thermal calibration system
C374SE15001, C073S001340, C073S204110
Reexamination Certificate
active
08075178
ABSTRACT:
Circuitry is disclosed for the calibration of heating element and ambient temperature sensors, comprising: a) an amplifier having positive and negative inputs, and an output; b) one or more heating MOS transistors selectably coupled in parallel and having 1) a heating transistor drain coupled to the positive input of the amplifier; 2) a heating transistor source configured to receive a supply voltage; and 3) a heating transistor gate coupled to the amplifier output; c) one or more ambient MOS transistors selectably coupled in parallel and having 1) an ambient transistor drain, 2) an ambient transistor gate coupled to the amplifier output; and 3) an ambient transistor source configured to receive the supply voltage; d) a temperature difference resistance configured: 1) to be coupled at least partially between an ambient connection and the ambient transistor drain; and 2) to be coupled at least partially between the ambient connection and the negative input of the amplifier.
REFERENCES:
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patent: 6763710 (2004-07-01), Mayer et al.
patent: 7010971 (2006-03-01), Matsumoto et al.
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patent: 7401510 (2008-07-01), Ando
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patent: 2088402 (2009-08-01), None
Jaafar Maha
Krauss Mathias
Heslin Rothenberg Farley & & Mesiti P.C.
Smith R. A.
Zentrum Mikroelektronic Desden AG
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