Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-10-27
2008-10-28
Gutierrez, Diego (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C361S140000
Reexamination Certificate
active
07443178
ABSTRACT:
An electrical circuit for the temperature compensation of at least one measuring resistor structure integrated in a semiconductor body includes at least one further resistor structure which is likewise concomitantly integrated into the semiconductor body and is thermally coupled to the measuring resistor structure. The electrical circuit also includes a circuit arrangement which is electrically connected to the further resistor structure, feeds a current into the further resistor structure, and evaluates a temperature-dependent voltage dropped across the further resistor structure as a result. The temperature-dependent voltage dropped across the further resistor is used for temperature compensation of the measuring resistor structure.
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Gutierrez Diego
Infineon - Technologies AG
Maginot Moore & Beck
Nguyen Hoai-An D
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