Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-03-08
2005-03-08
Le, N. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S672000, C324S674000, C324S676000
Reexamination Certificate
active
06864691
ABSTRACT:
A circuit arrangement for detecting the capacitance or capacitance change of a capacitive circuit element or component, in which there is a capacitive noise voltage compensation element, which corresponds to the sensor capacitor, represented as a noise voltage compensation capacitor, and a noise voltage compensation electrode of the noise voltage compensation capacitor, which corresponds to the first electrode of the sensor capacitor, is connected to the second electrode of a storage capacitor. The noise voltage compensation capacitor can be influenced in the same way as the sensor capacitor by the LF noise voltage. In this way, the adulteration of the measurement result by LF noise voltages which otherwise occurs no longer takes place.
REFERENCES:
patent: 6194903 (2001-02-01), Schulz
patent: 197 01 899 (1997-10-01), None
patent: 197 44 152 (1999-04-01), None
Palata Jaromir
Schulz Joerg
i f m electronic GmbH
Le N.
Nixon & Peabody LLP
Safran David S.
Teresinski John
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