Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-05-23
2006-05-23
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S654000
Reexamination Certificate
active
07049832
ABSTRACT:
Circuit arrangement for determining the load current through an inductive load (L) connected to a supply voltage (Vbat) in a clocked manner includes a current measuring impedance (30) which can be connected in series with the inductive load (L), a first and second connecting terminal (31, 32), a measuring amplifier (20) having a first and second input (21, 22) and an output (23), and a level shifter arrangement (40) having first and second inputs (41, 42) and first and second outputs (43, 44) The arrangement is designed to map a potential present at the first input terminal (41) onto a potential shifted by a predetermined potential value at the first output terminal (43) and to map a potential present at the second input terminal (42) onto a potential shifted by a predetermined potential value at the second output terminal (44). First and switching device (S1A, S2A, S1B, S2B) are designed to connect the first connecting terminal (31, 32) of the current measuring impedance (30) to the inputs(21, 22) of the measuring amplifier (20).
REFERENCES:
patent: 2004/0044459 (2004-03-01), Wakao et al.
patent: 2422536 (1976-02-01), None
patent: 38 43 507 (1990-06-01), None
patent: 199 15 593 (2000-11-01), None
patent: 102 00 650 (2003-05-01), None
Allram Martin
Hausmann Michael
Novak Heinz
Maginot Moore & Beck
Nguyen Vincent Q.
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