Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-02-14
2006-02-14
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
06999892
ABSTRACT:
A circuit arrangement (10) for activating a sensor and evaluating its signals, in particular for parametric sensors with complex impedances. The circuit arrangement comprises at least one sensor (2) for acquiring mechanical data. In order to minimize or largely prevent temperature caused disturbances in a constructionally simple layout, the measuring signal, the absolute temperature, and the gradient temperature of the sensor (2) are acquired simultaneously, preferably by means of a microprocessor or microcomputer (3). A corresponding method for activating sensors and evaluating their signals is also described.
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Mednikov Felix
Sellen Martin
Wisspeintner Karl
Alston & Bird LLP
Micro-Epsilon Messtechnik GmbH & Co. KG
Nghiem Michael
Pretlow Demetrius
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