Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-09-05
2006-09-05
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000, C702S182000, C702S183000
Reexamination Certificate
active
07103494
ABSTRACT:
A circuit arrangement in which two parallel subcircuits having a same functionality have a same input signal applied to them, and their output signals are compared in a common comparison arrangement. The two subcircuits are designed differently in terms of sensitivity to changes in environmental or operating parameters. Impermissible environmental parameters are indicated if the output signals differ from one another, and an alarm is generated.
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Khoo et al., Single-Transistor Transparent-Latch Clocking, 1995, IEEE Integrated Circuits and Systems Laboratory, University of California, Los Angeles, pp. 331-341.
Dickstein & Shapiro LLP
Hoff Marc S.
Infineon - Technologies AG
Suarez Felix
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