Circuit arrangement and data processing method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Details

C702S118000, C702S182000, C702S183000

Reexamination Certificate

active

07103494

ABSTRACT:
A circuit arrangement in which two parallel subcircuits having a same functionality have a same input signal applied to them, and their output signals are compared in a common comparison arrangement. The two subcircuits are designed differently in terms of sensitivity to changes in environmental or operating parameters. Impermissible environmental parameters are indicated if the output signals differ from one another, and an alarm is generated.

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patent: 1 154 375 (2001-11-01), None
Khoo et al., Single-Transistor Transparent-Latch Clocking, 1995, IEEE Integrated Circuits and Systems Laboratory, University of California, Los Angeles, pp. 331-341.

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