Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-07-11
2006-07-11
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C375S355000
Reexamination Certificate
active
07076377
ABSTRACT:
A circuit, apparatus and method obtains system margin at the receive circuit using phase shifted data sampling clocks while allowing the CDR to remain synchronized with the incoming data stream in embodiments. In an embodiment, a circuit includes first and second samplers to sample a data signal and output data and edge information in response to a data clock signal and an edge clock signal. A phase detector generates phase information in response to the data information and the edge information. A clock phase adjustment circuit generates the data clock signal and the edge clock signal in response to the data information during a synchronization mode. The clock phase adjustment circuit increments a phase of the data clock signal during a waveform capture mode.
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Horowitz Mark
Kim Dennis
Stonecypher William
Zerbe Jared
Baran Mary Catherine
Hoff Marc S.
Rambus Inc.
Vierra Magen Marcus & DeNiro LLP
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