Coded data generation or conversion – Converter compensation – Temperature compensation
Reexamination Certificate
2008-01-29
2008-01-29
Mai, Lam T. (Department: 2819)
Coded data generation or conversion
Converter compensation
Temperature compensation
C341S120000
Reexamination Certificate
active
07324027
ABSTRACT:
A circuit for testing an analog-digital converter includes: a subtracter which receives a converted value having a plurality of bits outputted from the analog-digital converter and an expected value having a plurality of bits, the subtracter calculating a difference value having a plurality of bits between the converted value and the expected value; and a logical operation circuit which receives the difference value, the logical operation circuit performing an exclusive-NOR operation between adjacent bits in the plurality of bits constituting the difference value, thereby outputting an exclusive-NOR value having a plurality of bits.
REFERENCES:
patent: 5150121 (1992-09-01), Newell et al.
patent: 5856799 (1999-01-01), Hamasaki et al.
patent: 11-326465 (1999-11-01), None
Mai Lam T.
Nixon & Peabody LLP
OKI Electric Industry Co., Ltd.
Studebaekr Donald R.
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