Circuit and method for testing analog-digital converter

Details Circuit and method for testing analog-digital converter Circuit and method for testing analog-digital converter

2008-01-29

2008-01-29

Mai, Lam T. (Department: 2819)

Coded data generation or conversion

Converter compensation

Temperature compensation

C341S120000

Reexamination Certificate

active

07324027

ABSTRACT:
A circuit for testing an analog-digital converter includes: a subtracter which receives a converted value having a plurality of bits outputted from the analog-digital converter and an expected value having a plurality of bits, the subtracter calculating a difference value having a plurality of bits between the converted value and the expected value; and a logical operation circuit which receives the difference value, the logical operation circuit performing an exclusive-NOR operation between adjacent bits in the plurality of bits constituting the difference value, thereby outputting an exclusive-NOR value having a plurality of bits.

REFERENCES:
patent: 5150121 (1992-09-01), Newell et al.
patent: 5856799 (1999-01-01), Hamasaki et al.
patent: 11-326465 (1999-11-01), None

Affiliated with

Also associated with

Rating

Circuit and method for testing analog-digital converter does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuit and method for testing analog-digital converter, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit and method for testing analog-digital converter will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2807647