Circuit and method for testing an integrated circuit

Details Circuit and method for testing an integrated circuit Circuit and method for testing an integrated circuit

1996-08-14

1998-03-10

Nguyen, Hoa T.

Excavating

365201, G06F 1100

Patent

active

057270015

ABSTRACT:
A test mode detector (12a) that places a multi-pin integrated circuit (10) in test mode. The test mode detector (12a) comprises a pulse detector (25) that receives a control signal. The control signal controls when the integrated circuit (10) is in test mode. The test mode detector (12a) further includes a latch (27) that is responsive to the pulse detector (25) so as to set the latch (27) when the pulse detector (25) detects a pulse in the control signal that exceeds a threshold level. The latch provides a signal that places the integrated circuit (10) in test mode for a period of time that is greater than the duration of the pulse of the control signal.

REFERENCES:
patent: 4906862 (1990-03-01), Itano et al.
patent: 5019772 (1991-05-01), Dreibelbis et al.
patent: 5155704 (1992-10-01), Walther et al.
patent: 5212442 (1993-05-01), O'Toole et al.
patent: 5231605 (1993-07-01), Lee
patent: 5245577 (1993-09-01), Duesman et al.
patent: 5248075 (1993-09-01), Young et al.
patent: 5279975 (1994-01-01), Devereaux et al.
patent: 5339320 (1994-08-01), Fandrich et al.
patent: 5348164 (1994-09-01), Heppler
patent: 5367263 (1994-11-01), Ueda et al.
patent: 5373472 (1994-12-01), Ohsawa
patent: 5384533 (1995-01-01), Tokuda et al.
patent: 5384741 (1995-01-01), Haraguchi et al.
patent: 5391892 (1995-02-01), Devereaux et al.
patent: 5397908 (1995-03-01), Dennison et al.
patent: 5420869 (1995-05-01), Hatakeyama
patent: 5426649 (1995-06-01), Blecha, Jr.
patent: 5440241 (1995-08-01), King et al.
patent: 5440517 (1995-08-01), Morgan et al.
patent: 5442642 (1995-08-01), Ingalls et al.
patent: 5450362 (1995-09-01), Matsuzaki
patent: 5452253 (1995-09-01), Choi
patent: 5457400 (1995-10-01), Ahmad et al.
patent: 5467468 (1995-11-01), Koshikawa
patent: 5469393 (1995-11-01), Thomann
patent: 5475330 (1995-12-01), Watanabe et al.
patent: 5488583 (1996-01-01), Ong et al.
patent: 5526364 (1996-06-01), Roohparvar
patent: 5528162 (1996-06-01), Sato
patent: 5528603 (1996-06-01), Canella et al.
patent: 5541935 (1996-07-01), Waterson
patent: 5544108 (1996-08-01), Thomann

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