Circuit and method for storing data in operational,...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit

Reexamination Certificate

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C327S213000

Reexamination Certificate

active

10883965

ABSTRACT:
A clocked scan flip-flop2is provided in which a latch14within the diagnostic data path is reused to store an operational signal value during a sleep mode. The operational signal value is supplied to the latch14via a sleep mode path20through a transmission gate22(or other tristate driver) controlled by a sleep mode control signal SLP. The diagnostic clock signal SCLK, the operational clock signal CLK and the sleep mode control signal SLP together provide the control operations for controlling the various elements within the clocked-scan flip-flop2to move into and out of sleep mode.

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U.S. Appl. No. 10/860,643, filed Jun. 4, 2004, Martin Kinkade et al.

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