Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-05-30
2006-05-30
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S433000, C320S149000
Reexamination Certificate
active
07053632
ABSTRACT:
A circuit for predicting the dead time is provided. The circuit includes a plurality of integrators, a plurality of comparators, and a logic circuit. Based on a reference signal provided externally, a first charging operation is delayed by a predetermined delay time during one period of the reference signal, such that the integrators maintain at a voltage level in a next period of the reference signal. Then, the integrators further perform another charging operation during the next period, and the charging voltage is compared with the maintained voltage value. When the charging voltage exceeds the maintained voltage, a reset signal is generated by the logic circuit.
REFERENCES:
patent: 3621359 (1971-11-01), Schnegg
patent: 5896025 (1999-04-01), Yamaguchi et al.
Chu Hung-Sung
Hung Kun-Cheng
Liang Shen-Yao
Himax Technologies Inc.
J.C. Patents
Nguyen Vincent Q.
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