Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-09-20
2005-09-20
Cuneo, Kamand (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010
Reexamination Certificate
active
06946863
ABSTRACT:
A method for passing a voltage between an internal node inside a memory device and an external pin outside the memory device. The method includes passing an internal voltage from the internal node to the external pin during a read mode. The method also includes passing an external voltage from the external pin to the internal node during a force mode.
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Duesman Kevin G.
Loughmiller Daniel R.
Sher Joseph C.
Cuneo Kamand
Micro)n Technology, Inc.
Nguyen Jimmy
Schwegman Lundberg Woessner & Kluth P.A.
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