Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent
1987-12-22
1989-03-21
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Conductor identification or location
Inaccessible
341166, G01R 2702, H03K 1320
Patent
active
048146927
ABSTRACT:
The invention relates to a circuit and a method adapted for measuring and digitizing the value of a resistance. The circuit includes and A/D converter operating in accordance with a charge balancing principle, and a resistance network connected to the A/D converter so that the resistance is both a component of the A/D converter and of the resistance network. The A/D converter and the resistance network are interconnected in such a manner so as to permit only a purely resistive measurement. A processor is connected to the A/D converter for obtaining a composite measured resistance value from a plurality of individual measured resistance values. The method according to the invention permits accurate (or precise) resistance measurements having a high degree of resolution of an order of magnitude of 10.sup.5 points. The method is applicable in particular for temperature measurements, for examples in calorimeters or in precision scales, but also in other resistance measurements.
REFERENCES:
patent: 3660834 (1972-05-01), Picot
patent: 3786350 (1974-01-01), Munt
patent: 3810152 (1974-05-01), White
patent: 3875501 (1975-04-01), Hayashi
patent: 3875503 (1975-04-01), Hayashi
patent: 3895376 (1975-07-01), Uchida
patent: 3918050 (1975-11-01), Dorsman
patent: 3975727 (1976-08-01), Mader
patent: 4112428 (1978-09-01), Dorsman
patent: 4117722 (1978-10-01), Helmstetter
patent: 4228394 (1980-10-01), Crosby
patent: 4309692 (1982-01-01), Crosby
patent: 4349777 (1982-09-01), Mitamura
patent: 4390864 (1983-06-01), Ormond
patent: 4588984 (1986-05-01), Dorsman
patent: 4598270 (1986-07-01), Shutt
Van De Plassche, "A Sigma-Delta Modulator as an A/D Converter", IEEE Transactions on Circuits and Systems, Jul. 1978 at 510.
Jaeger and Daneshvar, "Design Limitations of Switched Capacitor Delta-Sigma ADCS", Proceedings of the Sixth Beinnial University/Government/Industry Microelectronics Symposium. Jun. 1985 at 152.
Harrison, Hellworth and Jaeger, "Delta-Sigma A/D Conversion Can Save $$ In Slow-Speed Applications", EDN, vol. 18, No. 6, Mar. 20, 1973 at 78.
Eisenzopf Reinhard J.
Mettler Instrument AG
Solis Jose M.
LandOfFree
Circuit and method for measuring and digitizing the value of a r does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Circuit and method for measuring and digitizing the value of a r, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit and method for measuring and digitizing the value of a r will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-479603