Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-05-10
2005-05-10
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C320S132000, C324S427000, C702S065000
Reexamination Certificate
active
06892148
ABSTRACT:
The remaining run-time (t_rem) of a battery is determined independently of the condition of the battery and the amount of load on the battery by obtaining the value of a present total zero-current capacity (Qmax) of the battery based on relaxed-battery OCV values measured just before and just after a charging or discharging cycle. A current through the battery is integrated to determine a transfer of charge (Q) from the battery, and a value of total run-time (t_total) that would be required to reduce the open circuit voltage of the battery to a predetermined lower limit (Vmin) is determined. The remaining run-time (t_rem) is determined by subtracting the duration of the integrating from the total run-time (t_total).
REFERENCES:
patent: 5600230 (1997-02-01), Dunstan
patent: 5650712 (1997-07-01), Kawai et al.
patent: 5652502 (1997-07-01), van Phuoc et al.
patent: 6100666 (2000-08-01), Ryu
patent: 6317697 (2001-11-01), Yoshikawa et al.
patent: 6480003 (2002-11-01), Ugaji et al.
Barsoukov Evgenij
Freeman David L.
Poole Dan R.
Barlow John
Brady W. James
Le John
Swayze, Jr. W. Daniel
Telecky , Jr. Frederick J.
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