Circuit and method for erasing flash memory array

Static information storage and retrieval – Floating gate – Particular biasing

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Details

3651853, 36518533, 36518524, G11C 1604

Patent

active

059954183

ABSTRACT:
A circuit and method for achieving compressed distributions of erased cell threshold voltages in an EEPROM array is disclosed. The invention, when used to condition flash memory cell arrays, results in increased endurance of such arrays, and eliminates the need for pre-programming operations before a bulk erase can take place. By eliminating the need to pre-program the memory array before each erasure, the process provides a signicant improvement for low power applications, because battery life is extended and write cycle time is enhanced.

REFERENCES:
patent: 5132935 (1992-07-01), Ashmore, Jr.
patent: 5600593 (1997-02-01), Fong

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