Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1995-04-27
1996-10-08
Tokar, Michael
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324677, 324678, G01R 3126
Patent
active
055635199
ABSTRACT:
A circuit and method is disclosed which determines the physical position of a selected resistance setting of a mechanical variable resistive component, such as a potentiometer, between its mechanical limits as a ratio of its selected resistance and its total resistance. The circuit includes a potentiometer, a capacitor and a microprocessor, which form a charging circuit. The microprocessor has three I/O pins, which are connected to the three terminals of the pot. The capacitor is connected in series to the pot, so that it can be charged by a voltage signal from the microprocessor either across the selected resistance of the pot's wiper or across the entire resistance of the pot. The microprocessor executes a program, which embodies the method of this invention. The program executed by the microprocessor enables the microprocessor to separately measure the time required to charge the capacitor to a predetermined threshold voltage first across the selected resistance and across the entire resistance of the device and then to generate the ratio of the two time intervals.
REFERENCES:
Microchip Technology, Inc. Embedded Control Handbook (1994) pp. 2-65 to 2-69.
Crump R. Tracy
Environmental Technology, Inc.
Tokar Michael
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