Circuit and method for detecting skew of transistor in...

Details Circuit and method for detecting skew of transistor in... Circuit and method for detecting skew of transistor in...

2007-10-02

2007-10-02

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C327S065000

Reexamination Certificate

active

11019395

ABSTRACT:
A circuit and method for easily detecting skew of a transistor within a semiconductor device are provided. The circuit for detecting the skew of the transistor includes a linear voltage generating unit for outputting a linear voltage by using a first supply voltage, a first attenuation unit for reducing variation width of the linear voltage according to the performance of the transistor, a saturation voltage generating unit for outputting a saturation voltage by using a second supply voltage, and a comparison unit for comparing an output of the first attenuation unit and the saturation voltage.

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patent: 11-161988 (1999-06-01), None

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