Circuit and method for detecting an amplitude and offset deviati

Details Circuit and method for detecting an amplitude and offset deviati Circuit and method for detecting an amplitude and offset deviati

1991-12-03

1993-03-09

Callahan, Timothy P.

328168, 328171, 328175, 328164, H03B 100, H03K 500, H03K 508

Patent

active

051929171

ABSTRACT:
To detect amplitude deviations and/or offset deviations in two sinusoidal signals (S1, S2), electrically staggered from each other by 90.degree., both signals (S1, S2) are evaluated by way of threshold stages (K11, K12, K21, K22). The zero passages of the one signal (S1, S2) each indicate trigger time points (1.sub.up, 1.sub.down, 2.sub.up, 2.sub.down) for the amplitude of the other signal (S2, S1) in each instance. The output signals (X1, X2, A, A, B, B) of the threshold stages (K11, K12, K21, K22) are analyzed in the a regulating mechanism. Regulation can take place in accordance with the errors detected.

REFERENCES:
patent: 3464022 (1969-08-01), Locheed et al.
patent: 3705980 (1972-12-01), Brickner et al.
patent: 3764923 (1973-10-01), Woodworth et al.
patent: 4267470 (1981-05-01), Kawakami et al.

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