Circuit and method for correction of defect pixel

Details Circuit and method for correction of defect pixel Circuit and method for correction of defect pixel

2007-08-28

2007-08-28

Patel, Kanjibhai (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C348S246000, C348S294000

Reexamination Certificate

active

10626539

ABSTRACT:
A semiconductor integrated circuit includes a check unit which compares a value of a pixel of interest with values of neighboring pixels contained in an image signal supplied from an image sensor, and determines based on the comparison whether the pixel of interest is defective, and a defect correcting unit which corrects the value of the pixel of interest by using values of surrounding pixels in response to the determination by the check unit that the pixel of interest is defective.

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patent: 6504572 (2003-01-01), Kramer et al.
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patent: 6674404 (2004-01-01), Lee et al.
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patent: 7009644 (2006-03-01), Sanchez et al.
patent: 7034873 (2006-04-01), Mendis et al.
patent: 2001307079 (2001-11-01), None

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