Circuit and method for controlling glitches in low intensity sig

Details Circuit and method for controlling glitches in low intensity sig Circuit and method for controlling glitches in low intensity sig

1995-04-19

1996-06-25

Gonzalez, Frank

Optics: measuring and testing

By particle light scattering

With photocell detection

356358, 356363, G01B 902

Patent

active

055305423

ABSTRACT:
A laser interferometer measurement system eliminates detection of "false" zero crossings in the measurement signal. The measurement signal is shifted in phase by an integrator or a differentiator. The positive portion of the shifted measurement signal is used to determine falling portions of the measurement signal while the negative portion of the shifted measurement signal is used to determine the rising portions of the measurement signal. Each portion is compared to the reference signal. A SR latch receives the result of each comparator. The output signal of the SR latch reflects the zero crossings of the measurement signal without the effects of noise.

REFERENCES:
patent: 4781462 (1988-11-01), Ferriss et al.
patent: 4870635 (1989-09-01), Block et al.
patent: 4900151 (1990-02-01), Ulbers
patent: 5018862 (1991-05-01), Aiello
patent: 5066128 (1991-11-01), Lu

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