Coded data generation or conversion – Converter compensation
Reexamination Certificate
2005-06-07
2005-06-07
Tokar, Michael (Department: 2819)
Coded data generation or conversion
Converter compensation
C341S120000, C348S180000, C348S241000, C348S301000, C348S302000, C348S308000
Reexamination Certificate
active
06903670
ABSTRACT:
A circuit and method measure the output voltage of a CMOS pixel in a manner that substantially reduces all columnar pattern noise due to mismatches in the signal processing circuits including the correlated double sampling amplifiers and A/D converters. The circuit includes a test switch, operatively connected between a reference voltage source and a correlated double sampling amplifier, for applying a test voltage from the reference voltage source when the state of the test switch is ON to the correlated double sampling amplifier. The reference voltage source produces a voltage corresponding to a full-scale voltage level to enable the determination of a gain error in the correlated double sampling amplifier and/or A/D converter; a voltage corresponding to ground to enable the determination of an offset error in the correlated double sampling amplifier and/or A/D converter; and a plurality of analog voltages ranging from analog ground to a full-scale voltage level to enable the determination of non-linearity errors in the A/D converter.
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Fife Keith Glen
Lee Hae-Seung
Gauthier & Connors
Nguyen Khai
SMAL Camera Technologies
Tokar Michael
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