Chuck for use in the testing of semiconductor wafers

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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Details

29416, 29624, 324158P, 339117P, G01R 3102, G01R 3122, H01B 1300

Patent

active

041045890

ABSTRACT:
A chuck for use in the testing of semiconductor wafers comprising first and second pluralities of electrically conductive members alternately arranged to provide a wafer receiving surface. The members are substantially completely electrically isolated from each other. Electric power leads and measurement sensing leads are provided to the first plurality of conductive members and the second plurality of conductive members respectively.

REFERENCES:
patent: 3333274 (1967-07-01), Forcier
patent: 3543214 (1970-11-01), Johnston
patent: 3611128 (1971-10-01), Nagata
patent: 3665509 (1972-05-01), Elkins

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Profile ID: LFUS-PAI-O-1982147

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