Chromium-free etching solution for si-substrates and uses...

Cleaning compositions for solid surfaces – auxiliary compositions – Cleaning compositions or processes of preparing – For cleaning a specific substrate or removing a specific...

Reexamination Certificate

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C510S176000, C438S008000, C438S494000, C438S745000, C438S752000, C438S753000, C438S689000, C134S001300, C134S041000, C134S042000

Reexamination Certificate

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07635670

ABSTRACT:
The present invention relates to a novel etching solution suitable for characterizing defects on semiconductor surfaces, including silicon germanium surfaces, as well as a method for treating semiconductor surfaces with an etching solution as disclosed herein. This novel etching solution is chromium-free and enables a highly sufficient etch rate and highly satisfactory etch results.

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