Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Making plural separate devices
Reexamination Certificate
2007-02-13
2007-02-13
Zarneke, David A. (Department: 2891)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
Making plural separate devices
C438S113000, C438S107000, C257SE21506, C257SE21599
Reexamination Certificate
active
10988523
ABSTRACT:
Disclosed are a chip scale package and a method of fabricating the chip scale package. The chip scale package comprises conductive layers with a designated depth formed on an upper and a lower surfaces of a chip, and electrode surfaces formed on the same side surfaces of the conductive layers, which are connected to corresponding connection pads of a printed circuit board. The chip scale package is miniaturized in the whole package size. Further, the method of fabricating the chip scale package does not require a wire-bonding step or a via hole forming step, thereby simplifying the fabrication process of the chip scale package and improving the reliability of the chip scale package.
REFERENCES:
patent: 5441898 (1995-08-01), Richards et al.
patent: 5994167 (1999-11-01), Tai et al.
patent: 6177719 (2001-01-01), Huang et al.
patent: 6187615 (2001-02-01), Kim et al.
patent: 1246731 (2000-03-01), None
patent: 1 085 561 (2001-03-01), None
patent: 1085561 (2001-03-01), None
patent: 11-111742 (1999-04-01), None
patent: 11-243231 (1999-09-01), None
Bae Suk Su
Choi Yong Chil
Yoon Joon Ho
Lowe Hauptman & Berner LLP.
Samsung Electro-Mechanics Co. Ltd.
Zarneke David A.
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