Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Bump leads
Reexamination Certificate
2005-03-29
2005-03-29
Thai, Luan (Department: 2827)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Bump leads
C257S668000, C257S738000, C257S774000, C257S778000
Reexamination Certificate
active
06873046
ABSTRACT:
A carrier for use in a chip-scale package includes a polymeric film with apertures defined therethrough. The apertures, which are alignable with corresponding bond pads of a semiconductor device over which the carrier is to be positioned are at least partially filled with a quantity of conductive material. The carrier may also include laterally extending conductive traces that communicate electrically with the conductive material in the apertures. Contacts on a surface of the carrier may communicate with the conductive material within the apertures. A conductive bump may be disposed adjacent any of the contacts. The carrier may be positioned on a semiconductor device to form a chip-scale package. Such a chip-scale package may include a semiconductor device invertedly disposed over the carrier with bond pads of the semiconductor device being substantially aligned with apertures of the carrier.
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Akram Salman
Wood Alan G.
Thai Luan
TraskBritt
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