Chip buildup detection and control method and apparatus

Details Chip buildup detection and control method and apparatus Chip buildup detection and control method and apparatus

1994-11-22

1996-09-24

Envall, Jr., Roy N.

Boots, shoes, and leggings

36447419, 408 1R, 408 59, B23B 5106

Patent

active

055597130

ABSTRACT:
A chip buildup detection and control apparatus having a flow transducer and flow monitor to measure and monitor coolant flow to a cutter of a machine tool for detecting excessive chip buildup on the cutter and removing the buildup on the cutter which decreases machining cycle time while increasing cutter life and machine tool production. Excessive chip buildup on the cutter is detected when coolant flow to the cutter drops below a minimum flow rate limit. Buildup is removed upon detection by initiating a "pecking" cycle where the cutter is retracted from its position of engagement with the workpiece being machined for a predetermined dwell period of time. The machining cycle is aborted if coolant flow does not rise above the minimum limit by the end of the dwell period. If coolant flow rises above the minimum flow limit, the cutter is advanced almost to its previous position of engagement with the workpiece and machining is resumed. Preferably, if coolant flow to the cutter rises above a maximum flow rate limit, the "pecking" cycle is initiated and, thereafter, the machining cycle is aborted if flow does not drop below the maximum limit during a predetermined dwell period. In a preferred embodiment, a "pecking" cycle is initiated if coolant flow to the cutter falls outside a normal flow rate window of between the minimum and maximum flow rate limits. Therefore, "pecking" cycles are only initiated when excessive chip buildup or cutter failure is detected.

REFERENCES:
patent: 4529340 (1985-07-01), O'Dell
patent: 5028176 (1991-07-01), Delventhal et al.
patent: 5152641 (1992-10-01), Overmyer et al.

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