Coating processes – Coating by vapor – gas – or smoke
Patent
1989-01-25
1991-06-25
Morgenstern, Norman
Coating processes
Coating by vapor, gas, or smoke
427255, 437233, C23C 1600, H01L 21469
Patent
active
050265741
ABSTRACT:
A deposition process includes the steps of heating a substrate, and passing silane gas over the substrate such that the heated substrate causes decomposition of the silane gas thereby to cause deposition of polysilicon film on the substrate. The temperature of the substrate and the pressure of the silane gas are controlled so as to increase the grain size of the deposited films.
REFERENCES:
patent: 3112997 (1963-12-01), Benzing et al.
patent: 3900597 (1975-08-01), Chruma et al.
patent: 4001762 (1977-01-01), Aoki et al.
patent: 4113551 (1978-09-01), Bassous et al.
patent: 4129463 (1978-12-01), Cleland et al.
patent: 4351856 (1982-09-01), Matsui et al.
patent: 4363828 (1982-12-01), Brodsky et al.
patent: 4443488 (1984-03-01), Little et al.
"Thin Film Process", Ed. Vossen et al., pp. 274-278, Academic Press, N.Y., 1978.
"Chemical Vapor Depositon", by Blocker, Deposition Technologies for Film and Coatings, Noyes Publication, 1982, pp. 335-364.
Cauer et al., "Chemical Vapor Deposition Polycrystallin Si", J. Elecrochem Soc.; Solid State Science & Tech., pp. 1565-1570, vol. #119, #11, date unknown (Nov.).
Zolinger et al., "Growth Conditions & Properties of Evaporated Semicrystalline Si Layers", Thin Solid Films, 58, #1 (15 Mar. 1979), pp. 89-93.
Economu Nikolaos A.
Meakin Douglas B.
Morgenstern Norman
Padgett Marianne L.
The General Electric Company p.l.c.
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