Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2007-02-27
2007-02-27
Chen, Kin-Chan (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
C438S008000, C451S056000
Reexamination Certificate
active
10892096
ABSTRACT:
A chemical mechanical polishing pad. The pad contains a water-insoluble matrix and Water-soluble particles dispersed in the water-insoluble matrix material and has a polishing surface and a non-polishing surface on a side opposite to the polishing surface. The pad has a light transmitting area which optically communicates from the polishing surface to the non-polishing surface. The non-polishing surface of the light transmitting area has a surface roughness (Ra) of 10 pm or less.
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Hasegawa Kou
Hosaka Yukio
Kawahashi Nobuo
Shiho Hiroshi
Chen Kin-Chan
JSR Corporation
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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