Abrading – Flexible-member tool – per se – Interrupted or composite work face
Reexamination Certificate
2007-01-30
2007-01-30
Nguyen, Dung Van (Department: 3723)
Abrading
Flexible-member tool, per se
Interrupted or composite work face
C451S526000
Reexamination Certificate
active
11442076
ABSTRACT:
The polishing pad is suitable for planarizing at least one of semiconductor, optical and magnetic substrates. The polishing pad includes a polymeric matrix having a top polishing surface; and the top polishing surface has polymeric polishing asperities or forms polymeric polishing asperities upon conditioning with an abrasive. The polymeric polishing asperities extend from the polymeric matrix and represent the portion of the top polishing surface that can contact a substrate during polishing. The polymeric polishing asperities are from a polymeric material having a bulk ultimate tensile strength of at least 6,500 psi (44.8 MPa) and a bulk tear strength of at least 250 lb/in. (4.5×103g/mm).
REFERENCES:
patent: 3577386 (1971-05-01), Maier
patent: 5578362 (1996-11-01), Reinhardt et al.
patent: 5814409 (1998-09-01), Hane et al.
patent: 6022268 (2000-02-01), Roberts et al.
patent: 6022903 (2000-02-01), Younes et al.
patent: 6095902 (2000-08-01), Reinhardt
patent: 6267644 (2001-07-01), Molnar
patent: 6454634 (2002-09-01), James et al.
patent: 6514301 (2003-02-01), Lombardo
patent: 6648733 (2003-11-01), Roberts et al.
patent: 6682402 (2004-01-01), Roberts et al.
patent: 6736709 (2004-05-01), James et al.
patent: 6860802 (2005-03-01), Vishwanathan et al.
patent: 7074115 (2006-07-01), James et al.
patent: 2003/0148722 (2003-08-01), Lombardo et al.
patent: 2004/0198193 (2004-10-01), Tajima et al.
patent: 2005/0171225 (2005-08-01), Kulp
Szycher, Michael; Szycher's Handbook of Polyurethanes, 1999, pp. 11-1:11-23, CRC Press LLC, USA.
Biederman Blake T.
Nguyen Dung Van
Rohm and Haas Electronic Materials CMP Holdings Inc.
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