Chemical ionization source for mass spectrometry

Radiant energy – Ionic separation or analysis – With sample supply means

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250423R, B01D 5944, H01J 4900

Patent

active

060375876

ABSTRACT:
A mass spectrometer having an ionization source containing a chemical ionization chamber, wherein the inner surfaces of the chamber are formed from molybdenum to reduce adsorption, degradation and decomposition of an analyte and to reduce adverse ion/surface reactions is disclosed. A method of reducing adsorption, degradation and decomposition of an analyte and reducing adverse ion/surface reactions in an ionization source containing a chemical ionization chamber of a mass spectrometer including the step of forming the inner surfaces of the chamber from molybdenum is also disclosed. The inner surfaces may formed from molybdenum by constructing the entire chamber or the inner surfaces of the chamber from molybdenum; by depositing, plating or coating molybdenum on the inner surfaces of the chamber; or by a combination thereof. Suitable forms of molybdenum include solid molybdenum, mixtures containing at least 10% by weight molybdenum, and reaction products containing molybdenum.

REFERENCES:
patent: 3265889 (1966-08-01), Doctoroff
patent: 3356843 (1967-12-01), McElligott
patent: 3423584 (1969-01-01), Erickson
patent: 3461285 (1969-08-01), Werner
patent: 3553451 (1971-01-01), Uthe
patent: 3930163 (1975-12-01), Gerlach et al.
patent: 4032782 (1977-06-01), Smith et al.
patent: 4041346 (1977-08-01), Bursey et al.
patent: 4079254 (1978-03-01), Lawrence, Jr. et al.
patent: 4202080 (1980-05-01), Holzl et al.
patent: 4500787 (1985-02-01), Le Poole et al.
patent: 4529571 (1985-07-01), Bacon et al.
patent: 4538067 (1985-08-01), Cuomo et al.
patent: 4620102 (1986-10-01), Watanabe et al.
patent: 4760262 (1988-07-01), Sampayan et al.
patent: 4845367 (1989-07-01), Amirav et al.
patent: 4847476 (1989-07-01), Sato et al.
patent: 4883969 (1989-11-01), Ishida et al.
patent: 5055678 (1991-10-01), Taylor et al.
patent: 5198677 (1993-03-01), Leung et al.
patent: 5252892 (1993-10-01), Koshiishi et al.
patent: 5296714 (1994-03-01), Treglio
patent: 5304799 (1994-04-01), Kurzweg
patent: 5309064 (1994-05-01), Armini
patent: 5343047 (1994-08-01), Ono et al.
patent: 5384461 (1995-01-01), Jullien et al.
patent: 5447763 (1995-09-01), Gehlke
patent: 5561292 (1996-10-01), Buckley et al.
patent: 5563418 (1996-10-01), Leung
patent: 5629519 (1997-05-01), Palermo
patent: 5633497 (1997-05-01), Brittain et al.
patent: 5644131 (1997-07-01), Hansen
patent: 5650203 (1997-07-01), Gehlke
patent: 5663561 (1997-09-01), Franzen et al.

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