Chemical ionization reaction or proton transfer reaction...

Radiant energy – Ionic separation or analysis – With sample supply means

Reexamination Certificate

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C250S281000, C250S282000, C250S283000, C250S42300F, C250S424000

Reexamination Certificate

active

08003936

ABSTRACT:
A system, components thereof, and methods are described for time-of-flight mass spectrometry. A microwave or high-frequency RF energy source is used to ionize a reagent vapor to form reagent ions. The reagent ions enter a chamber and interact with a fluid sample to form product ions. The reagent ions and product ions are directed to a time-of-flight mass spectrometer module for detection and determination of a mass value for the ions. The time-of-flight mass spectrometer module can include an optical system and an ion beam adjuster for focusing, interrupting, or altering a flow of reagent and product ions according to a specified pattern. The time-of-flight mass spectrometer module can include signal processing techniques to collect and analyze an acquired signal, for example, using statistical signal processing, such as maximum likelihood signal processing.

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