Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate
2011-08-23
2011-08-23
Kim, Robert (Department: 2881)
Radiant energy
Ionic separation or analysis
With sample supply means
C250S281000, C250S282000, C250S283000, C250S42300F, C250S424000
Reexamination Certificate
active
08003936
ABSTRACT:
A system, components thereof, and methods are described for time-of-flight mass spectrometry. A microwave or high-frequency RF energy source is used to ionize a reagent vapor to form reagent ions. The reagent ions enter a chamber and interact with a fluid sample to form product ions. The reagent ions and product ions are directed to a time-of-flight mass spectrometer module for detection and determination of a mass value for the ions. The time-of-flight mass spectrometer module can include an optical system and an ion beam adjuster for focusing, interrupting, or altering a flow of reagent and product ions according to a specified pattern. The time-of-flight mass spectrometer module can include signal processing techniques to collect and analyze an acquired signal, for example, using statistical signal processing, such as maximum likelihood signal processing.
REFERENCES:
patent: 4965540 (1990-10-01), Sullivan
patent: 5051557 (1991-09-01), Satzger
patent: 5086255 (1992-02-01), Okamoto et al.
patent: 5216330 (1993-06-01), Ahonen
patent: 6031228 (2000-02-01), Abramson
patent: 6259091 (2001-07-01), Eiden et al.
patent: 6300626 (2001-10-01), Brock et al.
patent: 6782342 (2004-08-01), LeGore et al.
patent: 6989529 (2006-01-01), Wiseman
patent: 7005635 (2006-02-01), Ahern et al.
patent: 7030979 (2006-04-01), Hammer
patent: 7060987 (2006-06-01), Lee et al.
patent: 7095019 (2006-08-01), Sheehan et al.
patent: 7375317 (2008-05-01), Zhang
patent: 7439496 (2008-10-01), Stott et al.
patent: 2002/0003210 (2002-01-01), Marcus
patent: 2002/0066857 (2002-06-01), Hughey et al.
patent: 2002/0125423 (2002-09-01), Ebeling et al.
patent: 2004/0238755 (2004-12-01), Lee et al.
patent: 2005/0230614 (2005-10-01), Glukhoy
patent: 2006/0022132 (2006-02-01), Zhang
patent: 2007/0075051 (2007-04-01), Morrisroe
patent: 2007/0102634 (2007-05-01), Frey et al.
patent: 2009/0095901 (2009-04-01), Robinson et al.
patent: 2349270 (2000-10-01), None
patent: 2362259 (2001-01-01), None
“Quadrupole mass analyzer,” available at http://en.wikipedia.org/wiki/Quadrupole—mass—analyzer; visited Dec. 11, 2006, last modified Oct. 8, 2006.
“Quadrupole ion trap,” available at http://en.wikipedia.org/wiki/Quadrupole—ion—trap; visited Dec. 11, 2006, last modified Oct. 4, 2006.
“Time of flight,” available at http://en.wikipedia.org/wiki/Time-of-flight; visited Dec. 11, 2006, Last modified Dec. 4, 2006.
“Liquid chromatography-mass spectrometry,” available at http://en.wikipedia.org/wiki/liquid—chromatography-mass—spectrometry; Visited Dec. 11, 2006, last modified Dec. 1, 2006.
“Gas chromatography-mass spectrometry,” available at http://en.wikipedia.org/wiki/Gas—chromatogarphy-mass—spectrometry; visited Dec. 11, 2006, last modified Nov. 21, 2006.
“Fourier transform ion cyclotron resonance,” available at http://en.wikipedia.org/wiki/Fourier—transform—mass—spectrometry; visited Dec. 11, 2006, last modified Oct. 27, 2006.
“Electrostatic lens,” available at http://en.wikipedia.org/wiki/electrostatic—lens; visited Dec. 18, 2006, last modified Aug. 17, 2006.
“Mass spectrometry,” available at http://en.wikipedia.og/wiki/mass—spectrometer; visited Dec. 11, 2006, last modified May 27, 2006.
“Deconvolution,” available at http://en.wikipedia.org/wiki/deconvolution; visited Jan. 20, 2007, last modified Dec. 27, 2006.
“High Sensitivity PTR-MS: Ultra-Sensitive Real-Time Trace Gas Detector,” viewed at www/ptrms.com, prior to Oct. 10, 2007.
“High Sensitivity PTR-MS: Ultra-Sensitive Real-Time Trace Gas Detector,” Brochure of IONICON Analytik GmbH, Viewed at www/ptrns.com, prior to Oct. 10, 2007, Prior to Oct. 10, 2007.
“Standard PTR-MS: Sensitive Real-Time Trace Gas Detector,” viewed at www/ptrms.com, prior to Oct. 10, 2007.
“PTR-MS, Proton Transfer Reaction-Mass Spectrometry”, viwed at www/ptrms.com, prior to Oct. 10, 2007.
“PTR-MS, Online VOC Emissions Monitoring,” Powerpoint slides, viewed at www/ptrms.com, prior to Oct. 10, 2007.
“PTR-MS, Sensitive Real-Time Trace Gas Detector,” Powerpoint slides viewed at www/ptrms.com, prior to Oct. 10, 2007.
Bevington et al.,Data Reduction and Error Analysis for the Physical Sciences; Ch. 10 “Direct Application of the Maximum-Likelihood Method”, (2d. ed. 1992), pp. 180-183.
Amendment and Response from U.S. Appl. No. 11/869,978, filed Feb. 23, 2010.
Office Action from U.S. Appl. No. 11/869,978, Mailing Date Sep. 23, 2009.
Attwood Mark
Chen Xing
Holber William M.
Longson Mark Philip
Palk Jonathan Henry
Kim Robert
Logie Michael J
MKS Instruments Inc.
Proskauer Rose LLP
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