Chatter and profile measuring using capacitor sensors

Details Chatter and profile measuring using capacitor sensors Chatter and profile measuring using capacitor sensors

1992-04-22

1993-12-21

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324686, 73105, 29407, G01R 2726

Patent

active

052724433

ABSTRACT:
A method and apparatus for measuring chatter marks on a metal workpiece. The method includes first removing gross buckle or curvature in the workpiece by clamping the same in the device having an elongated jaws and in a manner that locates a portion of the workpiece outside of the jaws so that an elongated portion of the workpiece is available for inspection by capacitive sensors. The sensors are located adjacent at least one surface of the elongated portion of the workpiece, the sensor and workpiece forming an electrical capacitor when appropriate potentials are applied to the sensor and workpiece. The sensors are now moved along the surface in the elongated direction of the workpiece to detect chatter marks on the surface.

REFERENCES:
patent: 4814691 (1989-03-01), Garbini et al.
patent: 4849916 (1959-07-01), Abbe et al.
patent: 4910453 (1990-03-01), Abbe et al.
patent: 5012196 (1991-04-01), Baranski
patent: 5065103 (1991-11-01), Slinkman et al.
patent: 5189377 (1993-02-01), Rhoades et al.

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