Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1980-02-06
1982-09-07
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
307311, 356215, G01J 338, G01J 146
Patent
active
043481108
ABSTRACT:
There is provided a photodetector wherein charging current to a photodiode is integrated to determine an amount of discharge due to conduction of photoelectric current through the photodiode and thereby to measure intensity of photon flux incident to the photodiode, so that linearity of light input intensity versus output voltage characteristics can be improved and dynamic range of the measurement can be extended.
REFERENCES:
patent: 3547542 (1970-12-01), Bulpitt et al.
patent: 3732491 (1973-05-01), Battista
patent: 3934161 (1976-01-01), Caywood
patent: 4000418 (1976-12-01), Waldron et al.
patent: 4146332 (1979-03-01), Moore
Weckler, "Operation of p-n Junction Photodetectors in a Photon Flux Integrating Mode", IEEE Journal of Solid-State Circuits, vol. SC-2, No. 3, Sep. 1967, pp. 65-73.
Hitachi , Ltd.
McGraw Vincent P.
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