Radiant energy – Electron energy analysis
Reexamination Certificate
2003-11-04
2008-12-30
Souw, Bernard E (Department: 2881)
Radiant energy
Electron energy analysis
C250S261000, C250S306000, C250S307000, C250S282000, C250S3960ML, C250S397000
Reexamination Certificate
active
07470901
ABSTRACT:
A charged particle (e.g. photoelectron) spectrometer is operable in a first mode to produce an energy spectrum relating to the composition of a sample being analysed, and in a second mode to produce a charged particle image of the surface of the sample being analysed. A detector is used to detect charged particles produced in both modes of operation. A method of operation of the spectrometer includes the step of selecting which of said first and second modes to use and the detector being operated accordingly.
REFERENCES:
patent: 3937957 (1976-02-01), Schillalies et al.
patent: 4255656 (1981-03-01), Barrie et al.
patent: 4431921 (1984-02-01), Filthuth
patent: 4752685 (1988-06-01), Shiokawa et al.
patent: 4758723 (1988-07-01), Wardell et al.
patent: 4810883 (1989-03-01), Turner
patent: RE33275 (1990-07-01), Wardell et al.
patent: 4965861 (1990-10-01), Filthuth
patent: 5032724 (1991-07-01), Gerlach et al.
patent: 5265327 (1993-11-01), Faris et al.
patent: 5286974 (1994-02-01), Walker et al.
patent: 5315113 (1994-05-01), Larson et al.
patent: 5444242 (1995-08-01), Larson et al.
patent: 5451783 (1995-09-01), Coxon et al.
patent: 5465284 (1995-11-01), Karellas
patent: 5506414 (1996-04-01), Coxon
patent: 5566139 (1996-10-01), Abshire
patent: 5569916 (1996-10-01), Tomie
patent: 5644128 (1997-07-01), Wollnik et al.
patent: 5665967 (1997-09-01), Coxon et al.
patent: 6104029 (2000-08-01), Coxon et al.
patent: 6326617 (2001-12-01), Tomie et al.
patent: 6583420 (2003-06-01), Nelson et al.
patent: 6589779 (2003-07-01), McDevitt et al.
patent: 6661013 (2003-12-01), Jagutzki et al.
patent: 6693291 (2004-02-01), Nelson et al.
patent: 6765609 (2004-07-01), Kinoshita
patent: 6800852 (2004-10-01), Larson et al.
patent: 6891158 (2005-05-01), Larson et al.
patent: 6949741 (2005-09-01), Cody et al.
patent: 7019307 (2006-03-01), Gribb et al.
patent: 7030375 (2006-04-01), Testoni et al.
patent: 7205542 (2007-04-01), Mankos et al.
patent: 7285776 (2007-10-01), Nakamura et al.
patent: 2003/0080291 (2003-05-01), Larson et al.
patent: 2003/0080292 (2003-05-01), Watson et al.
patent: 2003/0205675 (2003-11-01), Nelson et al.
patent: 2003/0205676 (2003-11-01), Nelson et al.
patent: 2004/0021083 (2004-02-01), Nelson et al.
patent: 2004/0125913 (2004-07-01), Larson et al.
patent: 2004/0135081 (2004-07-01), Larson et al.
patent: 2004/0238735 (2004-12-01), Larson et al.
patent: 2004/0251419 (2004-12-01), Nelson et al.
patent: 2006/0060770 (2006-03-01), Page et al.
patent: 2006/0169893 (2006-08-01), Lee et al.
patent: 2007/0010973 (2007-01-01), deCecco et al.
patent: 2007/0115468 (2007-05-01), Barnard
patent: 0 246 841 (1987-11-01), None
patent: 1 170 778 (2002-01-01), None
patent: 2 359 187 (2001-08-01), None
Hatfield et al, “An integrated multichannel charged-particle sensing system”, Sensors and Actuators, vol. 54, No. 1-3, Jun. 1, 1996, pp. 777-781, XP004077965.
High Performance Imaging XPS—The Spherical Mirror Analyser available at http:/www.kratos.com/Agen/SMA.html, last updated Oct. 4, 1998.
Hopper Christopher Michael
Page Simon Charles
Park Colin Duncan
Kratos Analytical Limited
Souw Bernard E
Squire Sanders & Dempsey LLP
LandOfFree
Charged particle spectrometer and detector therefor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Charged particle spectrometer and detector therefor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Charged particle spectrometer and detector therefor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4021771