Charged particle deflection

Details Charged particle deflection Charged particle deflection

1984-05-01

1986-09-30

Anderson, Bruce C.

Radiant energy

With charged particle beam deflection or focussing

Magnetic lens

G21K 108, H01J 314

Patent

active

046148728

ABSTRACT:
An electron beam or similar charged particles may be deflected by passing through an electrostatic field produced in a deflecting structure. The degree of deflection is controlled by rotating the deflecting structure and path relative to one another. The beam may be rotated relative to the structure by a magnetic beam deflector which compensates for a range of electron energies within the beam so that all electrons are deflected in the electrostatic field by an equal amount.

REFERENCES:
patent: 3230409 (1966-01-01), Farrell
patent: 4169229 (1979-09-01), Feuerbaum
patent: 4335309 (1982-06-01), Anger et al.
patent: 4362945 (1982-12-01), Riecke

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