Radiant energy – Irradiation of objects or material – Ion or electron beam irradiation
Reexamination Certificate
2011-01-25
2011-01-25
Nguyen, Kiet T (Department: 2881)
Radiant energy
Irradiation of objects or material
Ion or electron beam irradiation
C250S398000
Reexamination Certificate
active
07875868
ABSTRACT:
A charged particle beam irradiation system comprises a high-speed steerer (beam dump device)100disposed in a course of a beam transport line4through which an ion beam is extracted from a charged-particle beam generator1. The beam dump device100is provided with dose monitoring devices105, 106for measuring a dose of an ion beam applied to a beam dump104so that the intensity of the ion beam can be measured without transporting the ion beam to irradiation nozzles15A through15D. Thus, the system is capable of adjusting the intensity of an ion beam extracted from a synchrotron without operating each component of a beam transport line, and an irradiation nozzle.
REFERENCES:
patent: 5260581 (1993-11-01), Lesyna et al.
patent: 5363008 (1994-11-01), Hiramoto et al.
patent: 7432516 (2008-10-01), Peggs et al.
patent: 0 779 081 (1997-06-01), None
patent: 2833602 (1998-10-01), None
Chu et al., “Instrumentation for treatment of cancer using proton and light-ion beams”, Review of Scientific Instruments, vol. 64, No. 8 (Aug. 1993) p. 2074-2093.
Proceedings of the Symposium on Accelerator and Related Technology for Application, vol. 7 (Jun. 2005) p. 35-36.
Moriyama Kunio
Nakayama Takahide
Nishiuchi Hideaki
Antonelli, Terry Stout & Kraus, LLP.
Hitachi , Ltd.
Nguyen Kiet T
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