Charged particle beam alignment method and charged particle...

Radiant energy – Means to align or position an object relative to a source or...

Reexamination Certificate

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Reexamination Certificate

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06864493

ABSTRACT:
An object of the present invention is to provide a charged particle beam apparatus and an alignment method of the charged particle beam apparatus, which make it possible to align an optical axis of a charged particle beam easily even when a state of the charged particle beam changes. The present invention comprises calculation means for calculating a deflection amount of an alignment deflector which performs an axis alignment for an objective lens, a plurality of calculation methods for calculating the deflection amount is memorized in the calculation means, and a selection means for selecting at least one of the calculation methods is provided.

REFERENCES:
patent: 5463221 (1995-10-01), Otaka et al.
patent: 5627373 (1997-05-01), Liu et al.
patent: 5659172 (1997-08-01), Wagner et al.
patent: 6333510 (2001-12-01), Watanabe et al.
patent: 2000-195453 (2000-07-01), None
patent: 2000-331637 (2000-11-01), None

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