Charged particle apparatus comprising a beam discriminator

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

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250396ML, 250398, H01J 37147

Patent

active

049623087

ABSTRACT:
For the selection of a pure electron beam or ion beam from a mixed beam, use is made of a combined electrostatic/magnetic deflection system, the electrostatic deflection system being formed, for example, by a tilted electrode system of a cascade system of electrodes present in the apparatus. The pure beam is directed onto an object to be irradiated as near to the object as possible in order to prevent renewed mixing.

REFERENCES:
patent: 4335309 (1982-06-01), Anger et al.
patent: 4687940 (1987-08-01), Ward et al.
patent: 4755685 (1988-07-01), Kawanami et al.
patent: 4835399 (1989-05-01), Hosaka et al.

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