Charged device model contact plate

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S555000, C324S537000, C324S756010, C324S757020

Reexamination Certificate

active

07733107

ABSTRACT:
A tester for applying very fast transmission line pulses (“VFTLP”) to select pins of a device under test (“DUT”), for example, an integrated circuit. The tester also provides for leakage measurement testing of the DUT after VFTLP testing. An end of a coaxial cable is received within an aperture formed in a metal ground plane. The outer conductor of the coaxial cable is attached to the metal ground plane and the inner conductor of the coaxial cable projects above an upper surface of the metal ground plane. A grip attached to the metal ground plane selectively retains the DUT upon the upper surface of the metal ground plane in a position placing a select pin in physical contact with the projecting inner conductor of the coaxial cable, completing the VFTLP circuit.

REFERENCES:
patent: 5132612 (1992-07-01), Burns et al.
patent: 5274336 (1993-12-01), Crook et al.
patent: 5543728 (1996-08-01), Grace et al.
patent: 5565788 (1996-10-01), Burr et al.
patent: 5594358 (1997-01-01), Ishikawa et al.
patent: 5642056 (1997-06-01), Nakajima et al.
patent: 6512362 (2003-01-01), Gieser
patent: 2001/0038294 (2001-11-01), Matsunaga et al.

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