Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device
Reexamination Certificate
2008-07-17
2009-10-20
Soward, Ida M (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Charge transfer device
C257S215000, C257S223000, C257S229000, C257S234000, C257S235000, C257S237000, C257S240000, C257S241000, C257S249000, C257SE27082, C257SE27083, C257SE27150, C257SE27151, C257SE27152, C257SE27153, C257SE27154, C257SE27155, C257SE27156, C257SE27157, C257SE27158, C257SE27159, C257SE27160, C257SE27163, C257SE29227, C257SE29228, C257SE29234, C257SE29235, C257SE29236, C257SE29237, C257SE29238, C257SE29239, C257SE29240
Reexamination Certificate
active
07605411
ABSTRACT:
An HCCD includes a channel21that transfers electric charges in an X direction, a channel25that transfers the electric charges in a Z1direction, a channel23that transfers the electric charges in a Z2direction, and a channel22that connects the channels23, 25to the channel21. The following relation is satisfied in impurity concentration of the channels: channel21channel22channel23, 25. A fixed DC voltage is applied to branch electrodes12a, 12babove the channel22. The channel22has protrusion portions19that protrude inward from an outer circumference, which connects T1and T2, and an outer circumference, which connects T3and T4. The protrusion portions19causes charges below the transfer electrode11bto move near the center of the channel22in a Y direction. Thereby, the travel distance of the charges in the channel22is reduced.
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Ikeda Katsumi
Kobayashi Makoto
Shiraki Hirokazu
Birch & Stewart Kolasch & Birch, LLP
Fujifilm Corporation
Soward Ida M
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