Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1975-09-04
1978-11-21
Esposito, Michael F.
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
118659, 346 75, 346153, 361228, 355 10, 427 24, G03G 1310, G03G 1510
Patent
active
041267117
ABSTRACT:
A liquid developer is presented to a charge pattern on a photoconductor surface as an evenly distributed array of droplets passing tangentially to it. The droplets emanate from a series of jets and are spread into an even pattern electromagnetically. The charge pattern is developed by the droplet which it draws to the photoconductor surface.
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Esposito Michael F.
Frenkel Stuart D.
Raizes Sheldon F.
Ralabate James J.
Xerox Corporation
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