Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-09-30
1992-12-08
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
358406, 358483, 361281, G01R 2726
Patent
active
051701294
ABSTRACT:
A method of detecting the charges which photo-electric conversion elements produce in correspondence to the density data of minute regions in an original image. In the method, a variable capacitor is charged with the capacitance set to a large value, and the voltage developed across the variable capacitor is detected with the capacitance set to a small value, whereby the voltage to be detected is increased as much, with an improvement in the signal detection accuracy.
REFERENCES:
patent: 2870338 (1959-01-01), Gillson, Jr.
patent: 3646413 (1972-02-01), Oomen
patent: 3668523 (1972-06-01), Kuhn
patent: 3668672 (1972-06-01), Parnell
patent: 4636714 (1987-01-01), Allen
patent: 4831325 (1989-05-01), Watson, Jr.
Nobue Mamoru
Sakai Kazuhiro
Brown Glenn W.
Fuji 'Xerox Co., Ltd.
Harvey Jack B.
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