Charge-based frequency measurement bist

Details Charge-based frequency measurement bist Charge-based frequency measurement bist

2005-04-26

2005-04-26

Chin, Stephen (Department: 2634)

Pulse or digital communications

Testing

C455S180300

Reexamination Certificate

active

06885700

ABSTRACT:
A charge-based frequency measurement BIST (CF-BIST) for clock circuits and oscillator circuits is described that requires no outside test stimulus and produces a digital test output. The CF-BIST technique performs structural and defect-oriented testing and uses existing blocks to save die area. The technique adds a multiplexer to the non-sensitive digital path. The system uses the existing VCO as the measuring device and divide-by-N as a frequency counter to reduce the area overhead. The described technique produces an efficient pass/fail evaluation, low-cost and practical implementation of on-chip BIST structure.

REFERENCES:
patent: 4672610 (1987-06-01), Salick
patent: 5132685 (1992-07-01), DeWitt et al.
patent: 5202626 (1993-04-01), Pham et al.
patent: 5793822 (1998-08-01), Anderson et al.
patent: 5912901 (1999-06-01), Adams et al.
patent: 6005407 (1999-12-01), Arabi et al.
patent: 6396889 (2002-05-01), Sunter et al.
Goteti, Devarayanadurg, Soma “DFT for Embedded Charge Pump PLL Systems Incorporating”, IEEE 1149.1, p. 10.3.2.*
Goteti et al. (1997), “DFT for Embedded Charge-Pump PLL Systems Incorporating IEEE 1149.1,”IEEE Custom Integrated Circuits Conf., pp. 210-213.
Huang et al. (1999), “Specification back-Propagation and Its Application to DC Fault Simulation for Analog/mixed-Signal Circuits,”IEEE VLSI Test Symposium, pp. 220-225.
Mixed Signal BIST [online]. LogicVision [retrieved on Sep. 24, 2000]. Retrieved from the Internet: <URL: www.logicvision.com/solution/tb_msbist.htm>.
p11BIST™—The Chip-Level Solution [online]. Logic Vision [retrieved on Sep. 21, 2000]. Retrieved from the Internet: <URL:www.logicvision.com/solution/p11bist.htm>.
Rayane et al. (1999), “A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits,”IEEE VLSITest Symposium, pp. 304-310.
Sachdev, M. (1995), “A realistic defect oriented testability methodology for analog circuits,”J. of Electron. Testing: Theory and Appl., vol. 6 pp. 265-276.
Soma, M. (Jan. 1996), “Challenges in Analog and Mixed-Signal Fault Models,”Circuit&Devices, pp. 16-19.
Toner, M.F. and Roberts, G.W. (1993), “A BIST Scheme for an SNR Test of a Sigma-Delta ADC,”IEEE Proceed. Intern. Test Conf., pp. 805-814.
Veillette, B.R. and Roberts, G.W. (1997), “On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops,”IEEE Proceed. Intern. Test Conf., pp. 776-784.
Veillette, B.R. and Roberts, G.W. (1998), “Stimulus Generation for Built-In Self-Test of Charge-Pump Phase-Locked Loops,”IEEE Proceed. Intern. Test Conf.pp. 698-707.
Xing, Y. (1998), “Defect-Oriented Testing of Mixed-Signal ICs: Some Industrial Experience,”IEEE Proceed. Intern. Test Conf., pp. 678-687.
Abramovici et al. (1990), “Digital Systems Testing and Testable Design,”Comp. Sci. Press, pp. 395-407.
Arabi, K. and Daminska, B. (1997), “Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits,”IEEE Proceed. Intern. Test Conf., pp. 786-795.
Arabi, K. and Daminska, B. (1997), “Design and Realization of an Accurate Built-In Current Sensor On-Line Power Dissipation Measurement and IDDQTesting,”Proceed. Intern. Test Conf., pp. 578-586.
Azais et al. (Jun. 1999), “A Unified Digital Test Technique for PLLs: Catastrophic Faults Covered,”IEEE Intern. Mixed Signal Test. Workshop[online] [retrieved on Mar. 14, 2001], Retrieved from the Internet: <URL:http://www.lirmm.fr/˜azais/publis/IMSTW99.ps>.
Devarayanadurg et al. (1996), “Hierarchy Based Statistical Fault Simulation of Mixed-Signal ICs,”IEEE Proceed. Intern. Test Conf., pp. 521-527.
Gardner, F.M. (Nov. 1980), “Charge-pump phase-lock loops,”IEEE Trans. Commun.vol. COM-28:1849-1858.

Affiliated with

Also associated with

Rating

Charge-based frequency measurement bist does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Charge-based frequency measurement bist, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Charge-based frequency measurement bist will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3377708